Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523708 | Electrical testing device | Shao-Wei Lu, Ya-Hung Lo, Shou-Jen Tsai | 2016-12-20 |
| 9519010 | Integrated high-speed probe system | Chun-Chi Wang, Chia-Tai Chang, Ya-Yun Cheng, Chao-Ping Hsieh | 2016-12-13 |
| 9500675 | Probe module supporting loopback test | Jun-Liang Lai, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou, Chan-Hung Huang | 2016-11-22 |
| 9470716 | Probe module | Hao Wei, Chen-Kang CHIU | 2016-10-18 |
| 9459279 | Electrical testing machine | Shao-Wei Lu, Hung-Chih Sung, Chun-Nan Chen | 2016-10-04 |
| 9442134 | Signal path switch and probe card having the signal path switch | Jun-Liang Lai, Chun-Chung Huang, Wei Chen, Hsin-Hsiang Liu, Kuang-Chung Chou | 2016-09-13 |
| 9410986 | Testing jig | Hao Wei, Chia-Nan Chou, Chih-Hao Ho | 2016-08-09 |
| 9316685 | Probe card of low power loss | Jun-Liang Lai | 2016-04-19 |