Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9455355 | Semiconductor device | Koji Sadamatsu, Yasuhiro Yoshiura | 2016-09-27 |
| 9401314 | Method of testing semiconductor device | Yasuhiro Yoshiura, Koji Sadamatsu | 2016-07-26 |
| 9257541 | High-breakdown-voltage power semiconductor device having a diode | Koji Sadamatsu, Yasuhiro Yoshiura | 2016-02-09 |