Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389944 | Test access architecture for multi-die circuits | Etienne Racine, Martin Keim, Jean-Francois Cote | 2016-07-12 |
| 9389945 | Test access architecture for stacked dies | Etienne Racine, Martin Keim, Jean-Francois Cote | 2016-07-12 |