Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9240306 | Device for spot size measurement at wafer level using a knife edge and a method for manufacturing such a device | Paul IJmert Scheffers, Abdourahmane Ange Sarr | 2016-01-19 |