Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9354047 | Rotational misalignment measuring device of bonded substrate, rotational misalignment measuring method of bonded substrate, and method of manufacturing bonded substrate | Masato Kannaka, Eiji Takahashi, Yuji Yamamoto, Masaru Akamatsu, Kunio Iba +1 more | 2016-05-31 |