Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9277186 | Generating a wafer inspection process using bit failures and virtual inspection | George Simon, Yuezhong Du | 2016-03-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9277186 | Generating a wafer inspection process using bit failures and virtual inspection | George Simon, Yuezhong Du | 2016-03-01 |