Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389349 | System and method to determine depth for optical wafer inspection | Mikhail Haurylau, Robert M. Danen | 2016-07-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389349 | System and method to determine depth for optical wafer inspection | Mikhail Haurylau, Robert M. Danen | 2016-07-12 |