Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9316589 | Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film | Toshihiro Kugimiya, Tomoya Kishi, Aya Miki | 2016-04-19 |
| 9279762 | Apparatus and method for measuring semiconductor carrier lifetime | Hiroyuki Takamatsu, Yoshito Fukumoto, Shingo Sumie | 2016-03-08 |