HS

Hidetaka Sawada

JE Jeol: 2 patents #1 of 40Top 3%
Overall (2016): #138,100 of 481,213Top 30%
2
Patents 2016

Issued Patents 2016

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9349565 Multipole lens, aberration corrector, and electron microscope — 2016-05-24
9256068 Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument Yu Jimbo 2016-02-09