Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506942 | Automatic analyzer and method for detecting measurement value abnormalities | Akihisa Makino, Akiko Watanabe | 2016-11-29 |
| 9400247 | Automatic analyzer | Kotaro Yamashita | 2016-07-26 |