YC

Yoel Cohen

NI Nova Measuring Instruments: 1 patents #2 of 11Top 20%
Overall (2016): #176,070 of 481,213Top 40%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9291911 Monitoring apparatus and method particularly useful in photolithographically processing substrates Giora Dishon, Moshe Finarov, Zvi Nirel 2016-03-22