Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9488554 | Method and system for reducing curtaining in charged particle beam sample preparation | Michael Schmidt, Hyun Hwa Kim, Sang Hoon Lee, Jeffrey Blackwood | 2016-11-08 |
| 9412560 | Bulk deposition for tilted mill protection | Sang Hoon Lee, Jeffrey Blackwood, Michael Schmidt | 2016-08-09 |
| 9384982 | Depositing material into high aspect ratio structures | Sang Hoon Lee, Jeffrey Blackwood | 2016-07-05 |
| 9336985 | Method for creating S/TEM sample and sample structure | Jeffrey Blackwood | 2016-05-10 |
| 9279752 | Method for preparing thin samples for TEM imaging | Michael Moriarty, Jeffrey Blackwood | 2016-03-08 |
| 9263306 | Protective layer for charged particle beam processing | Jeff Blackwood | 2016-02-16 |