Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9261458 | Microscope system and method for measuring refractive index of sample | — | 2016-02-16 |
| 9261689 | Scanning optical microscope | Yoshihiro Shimada, Makio Ueno, Naoki Hayashi, Eiji Yokoi | 2016-02-16 |