NS

Nigel P. Smith

NI Nanometrics Incorporated: 1 patents #1 of 6Top 20%
Overall (2016): #276,603 of 481,213Top 60%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9239523 Diffraction based overlay linearity testing Jie Li, Zhuan Liu, Silvio J. Rabello 2016-01-19