NP

N. William Parker

FE Fei: 3 patents #6 of 108Top 6%
Overall (2016): #60,884 of 481,213Top 15%
3
Patents 2016

Issued Patents 2016

Patent #TitleCo-InventorsDate
9494516 System and method for simultaneous detection of secondary electrons and light in a charged particle beam system Mark W. Utlaut 2016-11-15
9478390 Integrated light optics and gas delivery in a charged particle lens Marcus Straw, Jorge Filevich, Aurelien Philippe Jean Maclou Botman, Steven Randolph, Clive D. Chandler +1 more 2016-10-25
9349564 Charged-particle lens that transmits emissions from sample Marcus Straw, Jorge Filevich 2016-05-24