Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9335347 | Method and apparatus for massively parallel multi-wafer test | John Andberg, Ira Leventhal, Matthew Losey, Yohannes Desta, Vincent E. Lopopolo +2 more | 2016-05-10 |
| 9250290 | Laterally driven probes for semiconductor testing | Florent Cros, Yohannes Desta | 2016-02-02 |