Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9513337 | Circuits and methods for fault testing | Aaron Cook, Dana Briere, Devon Fernandez, Naota Nakayama | 2016-12-06 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9513337 | Circuits and methods for fault testing | Aaron Cook, Dana Briere, Devon Fernandez, Naota Nakayama | 2016-12-06 |