Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9244019 | Method for measuring defects in a silicon substrate by applying a heat treatment which consolidates and enlarges the defects | Patrick Reynaud | 2016-01-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9244019 | Method for measuring defects in a silicon substrate by applying a heat treatment which consolidates and enlarges the defects | Patrick Reynaud | 2016-01-26 |