Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9518932 | Metrology optimized inspection | Craig MacNaughton, Ellis Chang | 2016-12-13 |
| 9401014 | Methods and systems for utilizing design data in combination with inspection data | Khurram Zafar, Sagar A. Kekare, Ellis Chang, Peter Rose | 2016-07-26 |