Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9374202 | Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation | Adee O. Ran, Amir Mezer, Ophir Gazinski, Sanjay R. Ravi, David G. Ellis +1 more | 2016-06-21 |