Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9423416 | Scanning probe microscope and measuring method using same | Akira Nambu, Tsuyoshi Yamamoto, Tomihiro Hashizume, Seiji Heike | 2016-08-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9423416 | Scanning probe microscope and measuring method using same | Akira Nambu, Tsuyoshi Yamamoto, Tomihiro Hashizume, Seiji Heike | 2016-08-23 |