Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9455119 | Charged particle beam apparatus | Makoto Sato, Tatsuya Asahata, Masahiro Kiyohara | 2016-09-27 |
| 9315898 | TEM sample preparation method | Hidekazu Suzuki | 2016-04-19 |
| 9310325 | Focused ion beam apparatus and method of working sample using the same | Makoto Sato | 2016-04-12 |
| 9260782 | Sample preparation method | Xin Man | 2016-02-16 |