Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9335368 | Method and apparatus for quantifying defects due to through silicon VIAs in integrated circuits | Premachandran CHIRAYARIKATHUVEEDU, Rakesh Ranjan, Anil Kumar | 2016-05-10 |