Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9500468 | Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures | Mahmoodul Haq, Gary L. Cloud | 2016-11-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9500468 | Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures | Mahmoodul Haq, Gary L. Cloud | 2016-11-22 |