Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9431960 | Solution testing equipment | Toshikazu Mukai | 2016-08-30 |
| 9366620 | Specimen measuring method | Takashi Kondo, Seiji Kamba, Sakura Tomita | 2016-06-14 |
| 9341561 | Aperture array structure and measurement method using the same | Takashi Kondo, Seiji Kamba | 2016-05-17 |