Issued Patents 2016
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9527731 | Methodology and system for wafer-level testing of MEMS pressure sensors | Peter T. Jones, William D. McWhorter, Raimondo P. Sessego | 2016-12-27 |
| 9475689 | MEMS parameter identification using modulated waveforms | Raimondo P. Sessego, Tehmoor M. Dar | 2016-10-25 |
| 9335340 | MEMS parameter identification using modulated waveforms | Raimondo P. Sessego, Tehmoor M. Dar | 2016-05-10 |
| 9335396 | MCU-based compensation and calibration for MEMS devices | Tehmoor M. Dar, Raimondo P. Sessego | 2016-05-10 |
| 9285404 | Test structure and methodology for estimating sensitivity of pressure sensors | Chad S. Dawson, Peter T. Jones | 2016-03-15 |