Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9329228 | Prognostic circuit of electromigration failure for integrated circuit | Yiqiang Chen, Yunfei En, Yun Huang, Yudong Lu | 2016-05-03 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9329228 | Prognostic circuit of electromigration failure for integrated circuit | Yiqiang Chen, Yunfei En, Yun Huang, Yudong Lu | 2016-05-03 |