Issued Patents 2016
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523645 | Lenticular wafer inspection | — | 2016-12-20 |
| 9395309 | Multiple angle computational wafer inspection | — | 2016-07-19 |
| 9357202 | High resolution imaging devices with wide field and extended focus | Changhuei Yang, Jigang Wu | 2016-05-31 |
| 9324541 | Certified wafer inspection | — | 2016-04-26 |
| 9319597 | System and method for color imaging under low light | — | 2016-04-19 |
| 9262811 | System and method for spatio temporal video image enhancement | — | 2016-02-16 |
| 9250194 | Wide field illumination for wafer inspection | — | 2016-02-02 |
| 9250187 | Labeled wafer inspection | — | 2016-02-02 |
| 9245445 | Optical target detection | Jonathan J. Hull, Sergey Chemishkain, Kathrin Berkner | 2016-01-26 |