Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312116 | Mass distribution spectrometry method and mass distribution spectrometer | Kota Iwasaki | 2016-04-12 |
| 9267902 | Method of analyzing sample using secondary ion emitted from sample and analyzer for performing analysis method | Manabu Komatsu, Hiroyuki Hashimoto, Naofumi Aoki | 2016-02-23 |
| 9252004 | Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging system | Yoichi Otsuka | 2016-02-02 |
| 9230787 | Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system | Yoichi Otsuka | 2016-01-05 |