Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9389192 | Estimation of XRF intensity from an array of micro-bumps | Alex Tokar, Alex Dikopoltsev, Isaac Mazor | 2016-07-12 |
| 9390984 | X-ray inspection of bumps on a semiconductor substrate | Isaac Mazor, Alex Tokar, Boris Yokhin | 2016-07-12 |