YD

Yehuda Udy Danino

Applied Materials: 1 patents #401 of 946Top 45%
📍 Bnei Brak, IL: #3 of 8 inventorsTop 40%
Overall (2016): #178,205 of 481,213Top 40%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9367911 Apparatus and method for defect detection including patch-to-patch comparisons Michele Dalla-Torre, Boris Sherman, Zion Hadad, Noga Bullkich 2016-06-14