Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7911206 | Method and apparatus for evaluating length of defect in eddy current testing | Akira Nishimizu, Yoshio Nonaka, Isao Yoshida, Motoyuki Nakamura, Masahiro Koike | 2011-03-22 |