Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7924025 | System, device, and method for embedded S-parameter measurement | William R. Eisenstadt, Jang Sup Yoon | 2011-04-12 |
| 7925229 | Power detector of embedded IC test circuits | William R. Eisenstadt, Jang Sup Yoon, Tao Zhang | 2011-04-12 |