Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8034712 | Method of fabricating dual damascene structure | Kuang-Yeh Chang | 2011-10-11 |
| 8019457 | Method of controlling result parameter of IC manufacturing procedure | — | 2011-09-13 |
| 7989804 | Test pattern structure | Da Yang, Chih-Ping Lee, Rui Cheng, Xing Zhang, Xu Jason Ma +3 more | 2011-08-02 |