Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7975316 | Atomic force microscope and interaction force measurement method using atomic force microscope | Masahiro Ota, Noriaki Oyabu, Masayuki Abe, Oscar Custance, Seizo Morita | 2011-07-05 |