Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080434 | Nondestructive testing method for oxide semiconductor layer and method for making oxide semiconductor layer | Norihiko Yamaguchi, Masao Ikeda | 2011-12-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8080434 | Nondestructive testing method for oxide semiconductor layer and method for making oxide semiconductor layer | Norihiko Yamaguchi, Masao Ikeda | 2011-12-20 |