Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051398 | Test method and system for characterizing and/or refining an IC design cycle | Clive Bittlestone, Mark E. Mason, Stephanie W. Butler | 2011-11-01 |
| 7865849 | System and method for estimating test escapes in integrated circuits | John Michael Carulli, Jr., Jayashree Saxena, Amit P. Vasavada | 2011-01-04 |