MM

Masashi Miyazaki

AD Advantest: 2 patents #14 of 142Top 10%
TC Taiyo Yuden Co.: 1 patents #40 of 105Top 40%
Overall (2011): #41,591 of 364,097Top 15%
3
Patents 2011

Issued Patents 2011

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
8060326 Measuring apparatus, measuring method and test apparatus Hiroshi Ito 2011-11-15
7999577 Apparatus and method for detecting a changing point of measured signal 2011-08-16
7928560 Composite multi-layer substrate and module using the substrate Mitsuhiro Takayama, Tatsuro Sawatari 2011-04-19