Issued Patents 2011
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8001437 | Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit | Kohei Miyase, Seiji Kajihara | 2011-08-16 |
| 7979765 | Generating device, generating method, program and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-07-12 |
| 7971118 | Conversion device, conversion method, program, and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-28 |
| 7962822 | Generating device, generating method, program and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-06-14 |
| 7945830 | Method and apparatus for unifying self-test with scan-test during prototype debug and production test | Laung-Terng Wang | 2011-05-17 |
| 7913144 | Diagnostic device, diagnostic method, program, and recording medium | Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Hiroshi Date | 2011-03-22 |
| 7904773 | Multiple-capture DFT system for scan-based integrated circuits | Laung-Terng Wang, Meng-Chyi Lin, Hsin-Po Wang, Chi-Chan Hsu, Shih-Chia Kao +1 more | 2011-03-08 |
| 7904857 | Computer-aided design system to automate scan synthesis at register-transfer level | Laung-Terng Wang | 2011-03-08 |