Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8000826 | Predicting IC manufacturing yield by considering both systematic and random intra-die process variations | Jianfeng Luo, Subarnarekha Sinha, Charles C. Chiang | 2011-08-16 |
| 7962873 | Fast evaluation of average critical area for ic layouts | Subarnarekha Sinha, Charles C. Chiang | 2011-06-14 |
| 7962882 | Fast evaluation of average critical area for IC layouts | Subarnarekha Sinha, Charles C. Chiang | 2011-06-14 |