Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8024622 | Abnormality detection frequency set when it is indicated that abnormality will occur | Kazuhiko NARUSHIMA, Shigekazu Yamagishi, Makoto Hashimoto, Masafumi Ono, Hinki Ryu +1 more | 2011-09-20 |
| 7867881 | Method of manufacturing nitride semiconductor substrate | Takeshi Meguro, Takayuki Suzuki | 2011-01-11 |