Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051717 | Method and apparatus for measuring flaw height in ultrasonic tests | Hiroyuki Fukutomi, Shan Lin | 2011-11-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051717 | Method and apparatus for measuring flaw height in ultrasonic tests | Hiroyuki Fukutomi, Shan Lin | 2011-11-08 |