Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8085056 | Circuit for testing internal voltage of semiconductor memory apparatus | Yoon-Jae Shin | 2011-12-27 |
| 7898270 | Circuit for testing internal voltage of semiconductor memory apparatus | Yoon-Jae Shin | 2011-03-01 |