Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7923267 | Method of measuring length of measurement object article in micro-structure | Masanao Munekane | 2011-04-12 |
| 7872231 | Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope | Masanao Munekane | 2011-01-18 |