Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968878 | Electrical test structure to detect stress induced defects using diodes | Rajni J. Aggarwal | 2011-06-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7968878 | Electrical test structure to detect stress induced defects using diodes | Rajni J. Aggarwal | 2011-06-28 |