Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7880493 | Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device | Kun-Up Kim, Chang Sik Kim, Doo-Seon Lee | 2011-02-01 |