Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8056032 | Methods for measuring mean-to-target (MTT) based on pattern area measurements and methods of correcting photomasks using the same | Hyung Joo Lee, Yo Han Choi, Jong Won Kim, Dong-Hoon Chung | 2011-11-08 |