JP

Joo-Sung Park

Samsung: 2 patents #2,269 of 8,673Top 30%
Overall (2011): #89,948 of 364,097Top 25%
2
Patents 2011

Issued Patents 2011

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7948249 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same 2011-05-24
7863917 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same 2011-01-04