Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7971117 | Test circuits of semiconductor memory device for multi-chip testing and method for testing multi chips | Young Dae Lee, Chang Sik Kim, Soo Hwan Kim | 2011-06-28 |
BL
Byong-Kwon Lee
Overall (2011): #339,558 of 364,097Top 95%
1
Patents 2011