MI

Masahiro Ishida

AD Advantest: 12 patents #1 of 142Top 1%
TK Terumo Kabushiki Kaisha: 1 patents #29 of 93Top 35%
PA Panasonic: 1 patents #1,599 of 4,214Top 40%
📍 Yokohama, CA: #5 of 147 inventorsTop 4%
Overall (2011): #1,555 of 364,097Top 1%
14
Patents 2011

Issued Patents 2011

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
8068538 Jitter measuring apparatus, jitter measuring method and test apparatus Kiyotaka Ichiyama, Yasuhide Kuramochi, Takahiro Yamaguchi 2011-11-29
8045605 Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus Kiyotaka Ichiyama 2011-10-25
8043266 Indwelling needle assembly Takato Murashita, Masaki Fukuda 2011-10-25
8014465 Digital modulator, digital modulating method, digital transceiver system, and testing apparatus Kiyotaka Ichiyama, Takahiro Yamaguchi 2011-09-06
8000931 Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device Kiyotaka Ichiyama, Takahiro Yamaguchi 2011-08-16
7971107 Calculation apparatus, calculation method, program, recording medium, test system and electronic device Kiyotaka Ichiyama 2011-06-28
7957458 Jitter measurement apparatus, jitter measurement method, test apparatus and electronic device Kiyotaka Ichiyama, Takahiro Yamaguchi, Mani Soma 2011-06-07
7945403 Signal measurement apparatus, signal measurement method, recording media and test apparatus Atsuya Ono 2011-05-17
7945405 Jitter measurement apparatus, jitter measurement method, recording media, communication system and test apparatus Kiyotaka Ichiyama 2011-05-17
7933728 Skew measurement apparatus, skew measurement method, recording media and test apparatus 2011-04-26
7917331 Deterministic component identifying apparatus, identifying, program, recording medium, test system and electronic device Kiyotaka Ichiyama, Takahiro Yamaguchi 2011-03-29
7915633 Nitride semiconductor device and manufacturing method thereof 2011-03-29
7903776 Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus Kiyotaka Ichiyama, Takahiro Yamaguchi 2011-03-08
7904776 Jitter injection circuit, pattern generator, test apparatus, and electronic device Kiyotaka Ichiyama 2011-03-08